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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   247975 Nova   Nova   SCAN-2040  Metrology Equipment - Other in Metrology Equipment 4 x NOVA SCAN-2040 Measurement System: NOVASCAN SCAN-2040 FILMTHICKNES INSPECTION 4 x Integriertes Ebara Measurement Systems and spare parts listed in file below 1   Dresden, Saxony 251076 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes 1   Singapore 254249 AMAT   AMAT   UVision 6  Wafer Inspection Microscopes in Optical Microscopes 1   N* Malta, New York 254250 AMAT   AMAT   UVision 6  Wafer Inspection Microscopes in Optical Microscopes 1   N* Malta, New York 252611 Applied Materials   Applied Materials   Verity1 SEM  Scanning Electron Microscopes in Inspection Equipment AMAT Verity1 SEM, 300mm, s/n: U-757: Applied VeritySEM 1   Singapore 248208 Applied Materials   Applied Materials   G3 Lite  Scanning Electron Microscopes in Inspection Equipment AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041 1   Singapore 204578 Orbotech   Orbotech   Ultra Discovery VM  Metrology Equipment - Other in Metrology Equipment AOI Orbotech Ultra Discovery VM: Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits High throughput and superior detection with minimal number of false calls Especially designed for inspection of the finest lines down to 10μm Quick set-up even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP TechnologyTM Push-to-Scan®: A ‘no set-up’ process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full ‘Step and Repeat’ functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed     1 24,906.67 Regensburg, Bavaria 209828 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology   1   Malta, New York 251067 HIMS   HIMS   HPI-1000  Wafer Inspection Microscopes in Optical Microscopes HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001: TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) 1   Singapore 251068 HIMS   HIMS   HPI-1000  Wafer Inspection Microscopes in Optical Microscopes HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001: TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) 1   Singapore 237745 HMI   HMI   eScan 500  Scanning Electron Microscopes in Inspection Equipment HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm 1   Malta, New York 251081 HMI   HMI   ESCAN380  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 253752 HSEB   HSEB   MMT 300  Wafer Inspection Microscopes in Optical Microscopes 1   Dresden, Saxony 253234 HSEB   HSEB   MMT300 V2  Wafer Inspection Microscopes in Optical Microscopes 1   Dresden, Saxony 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1   Malta, New York 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1   Malta, New York 254223 Jordan Valley JVX6200i, 300mm, s/n: M872  Jordan Valley JVX6200i, 300mm, s/n: M872  Other Items in Microscopes 1   N* Malta, New York 251079 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251077 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254255 KLA-Tencor   KLA-Tencor   2835  Wafer Inspection Microscopes in Optical Microscopes KLA 2835, 300mm, s/n: 1340334: Brightfield Inspection 1   N* Malta, New York 251078 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251080 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251617 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 237748 KLA-Tencor   KLA-Tencor   AMI2900  Wafer Inspection Microscopes in Optical Microscopes KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module   1   Malta, New York 252339 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 252340 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 253040 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9145: KLA-Tencor AIT II w/ ADC. Defect Inspection 1   Burlington, Vermont 253033 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9234: AIT II w/ ADC. Defect Inspection Tool 1   Burlington, Vermont 254150 KLA-Tencor   KLA-Tencor   OP2600DUVI  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP2600DUVI, 200mm, s/n: 6454: Film thickness measurement 1   Singapore 254149 KLA-Tencor   KLA-Tencor   OP3260I  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP3260I, 200mm, s/n: 6678: Film thickness measurement 1   Singapore 254148 KLA-Tencor   KLA-Tencor   OP5240I  Wafer Inspection Microscopes in Optical Microscopes 1   Santa Clara, California 254147 KLA-Tencor   KLA-Tencor   UV1280SE  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor UV1280SE, 200mm, s/n: 991098: Film thickness measurement tool 1   Singapore 253038 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9152: AIT II w/ ADC. Defect Inspection 1   Burlington, Vermont 253037 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9262: AIT II w/ ADC. Defect Inspection Tool 1   Burlington, Vermont 253039 KLA-Tencor   KLA-Tencor   AIT  Wafer Inspection Microscopes in Optical Microscopes 1   Burlington, Vermont 254084 KLA-Tencor   KLA-Tencor   EDR 5200  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254087 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254086 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254085 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 205912 Matrix Corp   Matrix Corp   Matrix X3  Metrology Equipment - Other in Metrology Equipment Matrix X3 X-Ray System: high speed X-Ray system  1   Regensburg, Bavaria 241510 NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  Other Items in Microscopes NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 1   Malta, New York 253031 Rudolph Technologies   Rudolph Technologies   S3000-S  Wafer Inspection Microscopes in Optical Microscopes 1   Malta, New York 252025 Semilab   Semilab   SDI-FAAST_230  Metrology Equipment - Other in Metrology Equipment SDI METRON / Semilab SDI-FAAST_230: Configuration: Mainframe Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production but regular check Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport Modell MM3000) 1x DSP Lock-IN Amplifier 1x Roboter Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Fe Activation Box (SDI) 1x Roboter (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafetek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box mit Anleitungen, div. Kleinteilen, Kabel 1   Regensburg, Bavaria

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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Items from the following manufacturers are offered under Metrology Equipment: AMAT, Applied Materials, Inc., HIMS, HMI, HSEB, KLA-Tencor, Matrix Corp, Nova, Orbotech, Rudolph Technologies, Inc., Semilab