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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   251076 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes 1   Singapore 254249 AMAT   AMAT   UVision 6  Wafer Inspection Microscopes in Optical Microscopes 1   N* Malta, New York 254250 AMAT   AMAT   UVision 6  Wafer Inspection Microscopes in Optical Microscopes 1   N* Malta, New York 252611 Applied Materials   Applied Materials   Verity1 SEM  Scanning Electron Microscopes in Inspection Equipment AMAT Verity1 SEM, 300mm, s/n: U-757: Applied VeritySEM 1   Singapore 248208 Applied Materials   Applied Materials   G3 Lite  Scanning Electron Microscopes in Inspection Equipment AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041 1   Singapore 209828 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology   1   Malta, New York 251067 HIMS   HIMS   HPI-1000  Wafer Inspection Microscopes in Optical Microscopes HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001: TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) 1   Singapore 251068 HIMS   HIMS   HPI-1000  Wafer Inspection Microscopes in Optical Microscopes HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001: TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) 1   Singapore 237745 HMI   HMI   eScan 500  Scanning Electron Microscopes in Inspection Equipment HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm 1   Malta, New York 251081 HMI   HMI   ESCAN380  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 253752 HSEB   HSEB   MMT 300  Wafer Inspection Microscopes in Optical Microscopes 1   Dresden, Saxony 253234 HSEB   HSEB   MMT300 V2  Wafer Inspection Microscopes in Optical Microscopes 1   Dresden, Saxony 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1   Malta, New York 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1   Malta, New York 254223 Jordan Valley JVX6200i, 300mm, s/n: M872  Jordan Valley JVX6200i, 300mm, s/n: M872  Other Items in Microscopes 1   N* Malta, New York 251079 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251077 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254255 KLA-Tencor   KLA-Tencor   2835  Wafer Inspection Microscopes in Optical Microscopes KLA 2835, 300mm, s/n: 1340334: Brightfield Inspection 1   N* Malta, New York 251078 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251080 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251617 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 237748 KLA-Tencor   KLA-Tencor   AMI2900  Wafer Inspection Microscopes in Optical Microscopes KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module   1   Malta, New York 252339 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 252340 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 253040 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9145: KLA-Tencor AIT II w/ ADC. Defect Inspection 1   Burlington, Vermont 253033 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9234: AIT II w/ ADC. Defect Inspection Tool 1   Burlington, Vermont 254150 KLA-Tencor   KLA-Tencor   OP2600DUVI  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP2600DUVI, 200mm, s/n: 6454: Film thickness measurement 1   Singapore 254149 KLA-Tencor   KLA-Tencor   OP3260I  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP3260I, 200mm, s/n: 6678: Film thickness measurement 1   Singapore 254148 KLA-Tencor   KLA-Tencor   OP5240I  Wafer Inspection Microscopes in Optical Microscopes 1   Santa Clara, California 254147 KLA-Tencor   KLA-Tencor   UV1280SE  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor UV1280SE, 200mm, s/n: 991098: Film thickness measurement tool 1   Singapore 253038 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9152: AIT II w/ ADC. Defect Inspection 1   Burlington, Vermont 253037 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9262: AIT II w/ ADC. Defect Inspection Tool 1   Burlington, Vermont 253039 KLA-Tencor   KLA-Tencor   AIT  Wafer Inspection Microscopes in Optical Microscopes 1   Burlington, Vermont 254084 KLA-Tencor   KLA-Tencor   EDR 5200  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254087 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254086 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254085 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 241510 NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  Other Items in Microscopes NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 1   Malta, New York 253031 Rudolph Technologies   Rudolph Technologies   S3000-S  Wafer Inspection Microscopes in Optical Microscopes 1   Malta, New York

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Inspection Tools: AMAT, Applied Materials, Inc., HIMS, HMI, HSEB, KLA-Tencor, Rudolph Technologies, Inc.